Versions Compared

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

...

  • T1 = Proof test interval (h)
  • MTBF = Mean time between failures (hour)
  • MTTR = Mean time to restoration (hour)
  • MRT = Mean repair time (hour)
  • DC = Diagnostic coverage
  • β = The fraction of undetected failures that have a common cause
  • βD = Of those failures that are detected by the diagnostic tests, the fraction that have a common cause
  • βDU = Dangerous Failure rate (per hour) of a channel in a subsystem
  • PFDG = Average probability of failure on demand for the group of voted Channels
  • PFDS = Average probability of failure on demand for the sensor subsystem
  • PFDL = Average probability of failure on demand for the logic subsystem
  • PFDFE = Average probability of failure on demand for the final element subsystem
  • PFDSYS = Average probability of failure on demand of a safety function for the E/E/PE safety-related system
  • PFHG = Probability of failure per hour for the group of voted channels
  • PFHS = Probability of failure per hour for the sensor subsystem
  • PFHL = Probability of failure per hour for the logic subsystem
  • PFHFE = Probability of failure per hour for the final element subsystem
  • PFHSYS = Probability of failure per hour of a safety function for the E/E/PE safety-related system
  • λ = Total Failure rate (per hour) of a channel in a subsystem
  • λD = Dangerous failure rate (per hour) of a channel in a subsystem, equal to 0,5 λ
  • λDD = Detected dangerous failure rate (per hour) of a channel in a subsystem
  • λDU = Undetected dangerous failure rate (per hour) of a channel in a subsystem
  • λSD = Detected safe failure rate (per hour) of a channel in a subsystem
  • tCE = Channel equivalent mean down time (hour)
  • tGE = Voted group equivalent mean down time (hour)
  • tCE’ = Channel equivalent mean down time (hour)
  • tGE’ = Voted group equivalent mean down time (hour)
  • T2 = Interval between demands (h)
  • K = Fraction of the success of the auto test circuit in the 1oo2D system
  • PTC = Proof Test Coverage
  • 1 = High demand or continuous mode only
  • 2 = Low demand mode only

SIL-käyttö eri turvallisuusmäärittelyissä

...